摘要：【中文】本发明公开了一种MOS管自动功率老化测试系统及测试方法，所述测试系统由人机交互接口单元、电源单元和老化板三部分构成；人机交互接口单元通过RS485总线与老化板进行通信，实现老化数据的下载和老化状态的实时显示；电源单元采用可调电源为老化板提供工作电源，根据受试器件确定电源参数；老化板负责受试器件的老化工作，并将老化状况实时传输到人机交互接口单元；所述老化板包括恒定功率老化和循环加热老化两种工作模式。本发明老化测试系统及测试方法使老化过程中受试器件的结温尽量控制在最高允许结温附近，实现对受试MOS管的全面老化，老化更充分，使得MOS管测试更加可靠。 【EN】The invention discloses an automatic power aging test system and a test method for an MOS (metal oxide semiconductor) tube, wherein the test system consists of a human-computer interaction interface unit, a power supply unit and an aging board; the human-computer interaction interface unit is communicated with the aging board through an RS485 bus to realize the downloading of aging data and the real-time display of an aging state; the power supply unit adopts an adjustable power supply to provide a working power supply for the aging board, and determines power supply parameters according to the tested device; the aging board is responsible for the aging work of the tested device and transmits the aging condition to the human-computer interaction interface unit in real time; the aging board comprises two working modes of constant power aging and cyclic heating aging. The aging test system and the test method of the invention control the junction temperature of the tested device near the highest allowed junction temperature as much as possible in the aging process, realize the overall aging of the tested MOS tube, and the aging is more sufficient, so that the MOS tube test is more reliable.