摘要：【中文】一种示例模拟测试总线(ATB)设备包括：多个比较器电路，每个所述比较器电路具有输出端口以及一对包括反相端口和非反相端口的相反极性的输入端口；多个电路节点，其选择性地连接到第一极性的所述输入端口；以及至少一个数模转换器(DAC)，其用以驱动所述多个比较器电路的所述输入端口。所述设备另外包括数据存储和逻辑电路系统，所述数据存储和逻辑电路系统通过为每个比较器电路提供指示不准确性的校准数据集用于调节由所述多个比较器电路执行的比较操作，解释可归因于所述多个比较器电路的不准确性。 【EN】An example Analog Test Bus (ATB) device includes: a plurality of comparator circuits, each of the comparator circuits having an output port and a pair of opposite polarity input ports including an inverting port and a non-inverting port; a plurality of circuit nodes selectively connected to the input port of a first polarity; and at least one digital-to-analog converter (DAC) to drive the input ports of the plurality of comparator circuits. The apparatus additionally includes data storage and logic circuitry to interpret inaccuracies attributable to the plurality of comparator circuits by providing a calibration data set indicative of the inaccuracies for each comparator circuit for use in adjusting comparison operations performed by the plurality of comparator circuits.